This raises some interesting questions about "unit testing" hardware. I would assume one would design a board with some regular self testing. (This coukd of course be the problem).
And it would be moderately hard to cheaply fake a chips that met the requirements of form factor, power and so on - and still was able to respond to some basic interrogation but also was flawed in some way (ie the way that cuts out the expensive bit)
Inwoukd love to know the specifics here of how fake chips walk that line. Cos otherwise it feels like "OMG any electronics could fail at any moment and there is nothing we can do"
Self-testing most analog and sensing hardware is next to impossible in a circuit. Even testing them via specially designed test points can just not be possible at times.
A complex microchip can be easily caught. Simple one... Not necessarily.
And it would be moderately hard to cheaply fake a chips that met the requirements of form factor, power and so on - and still was able to respond to some basic interrogation but also was flawed in some way (ie the way that cuts out the expensive bit)
Inwoukd love to know the specifics here of how fake chips walk that line. Cos otherwise it feels like "OMG any electronics could fail at any moment and there is nothing we can do"